Benefit from unique technologies and leading expertise
The Karlsruhe Nano Micro Facility (KNMFi) offers a dedicated set of state-of-the-art technologies for structuring and characterizing a multitude of functional materials at the micro- and nanoscale.
KNMFi unifies 20+ technology clusters and 50+ scientists (as of 2020). KNMFi was launched in 2008 as KNMF by an initial technology investment budget of 23.3 Mio. Euro allocated by the Helmholtz Association of German Research Centers (HGF), since then regular updates and major additional investments have been dedicated to the continuous improvement of both, the value of the facility and the welfare of ourusers. Our technology experts support all users in all questions relating to the access and use of our technologies. They serve as local contacts and are ready to accompany you to reach your personal scientific goals. This may include conducting processes at the laboratories or organising overall workflows for your own project. It is recommended to select and contact the experts of the technologies of interest prior to a proposal submission. The user office will assist you to find the most appropriate experts.
User Office
Karlsruhe Nano Micro Facility
KIT-Campus North
Hermann-von-Helmholtz-Platz 1
76344 Eggenstein-Leopoldshafen
Germany
+49 721 608-23123
knmf-useroffice ∂ kit edu
Laboratory for Micro- and Nanostructuring
- 3D Direct Laser Writing (3D-DLW)
- 3D Printing (3DP)
- Dip-Pen Nanolithography (DPN) & Polymer Pen Lithography
- Direct Laser Writing (DLW)
- Dry Etching Cluster (DRIE)
- Electron Beam Lithography (EBL)
- Hot Embossing (HE)
- Lithography-based Ceramic Manufacturing (LCM) – launch by January 10, 2025
- Thermal Scanning Probe Lithography (t-SPL)
Laboratory for Microscopy and Spectroscopy
- 3D Atom Probe Tomography (APT)
- Atomic Force Microscopy (AFM)
- Auger Electron Spectroscopy (AES)
- Correlative MRI/NMR and X-ray measurement (CORREL)
- Focused Ion Beam (FIB)
- Helium Ion Microscope (HIM)
- Nano Tomography (nanoCT)
- Nuclear Magnetic Resonance (NMR)
- Single Crystal X-ray Diffraction (SCXD)
- Soft X-ray Spectroscopy, Microscopy, and Spectromicroscopy (WERA)
- Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS)
- Transmission Electron Microscopy (TEM)
- X-Ray Photoelectron Spectroscopy (XPS)